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Yield(Defect) Management System/Engineering Data Analysis



Price:
price negotiable
Brand Name:
GlorysoftCountry Region:
ChinaModel No:
YMS/EDA


Glorysoft 

Country: China
Main Products: MES/EAP/RPA/QMS/MCS/.....
View more
Price:
price negotiable
Brand Name:
GlorysoftCountry Region:
ChinaModel No:
YMS/EDA


Glorysoft 

China
Main Products:
MES/EAP/RPA/QMS/MCS/.....

Product information
Features
01—Module 1—
Data management and BI modules
02—Module II—
Standard statistical models and chart templates
03—Module III—
Data integration management and analysis based on business layers
04—Module IV—
Customized analysis model templates, integrated with FDC and ADC systems
Advantage Effect
Customized templates for yield tendency of the whole plant in panel industry
CP (chip probing) yield of semiconductor and Defect Map Overlay management
CP yield of semiconductor and Defect Map Overlay management
All products in the store
Equipment Automation Programming

Material Control System

Auto Defect Classification

Robotic Process Automation

Recipe Management system

Yield(Defect) Management System/Engineering Data Analysis


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