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Low temperature broadband dielectric measurement system
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PolyK
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PolyK
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U.S.A
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Low temperature broadband dielectric measurement system
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Product information

Polyk Technologies has developed a low temperature spectrum dielectric measurement system under high electric field, which better solves the problem of nonlinear dielectric response.

Nonlinear dielectric response
• When the dielectric constant is measured by LCR Meter or analyzer (Agilent/Keysight 4284A, E4980A,4294A), the loading voltage is usually about 1V; However, many piezoelectric ceramics (PZT) and polymers (PVDF) have nonlinear responses to loaded electric fields. In general, their dielectric constant and loss factor decrease at high pressure.
• In many applications, such as capacitors and drivers, where the dielectric layer is >10V/um or 100V/um at high electric fields, their effective dielectric constant and loss tanδ are very different from the @1Vrms measured by ordinary LCR meters and impedance analyzers.
A high voltage signal is loaded directly during dielectric testing, which poses a high risk of damage to the expensive LCR Meter if the sample suddenly experiences dielectric breakdown.

Therefore, Polyk Technologies developed this wide spectrum dielectric measurement system to effectively avoid the occurrence of the above problems.

Technical specification
• ** Voltage: ±4000V
• ** Current: ±20mA;
• Frequency range: 100Hz to 1MHz;
• Capacitance range: 100pF to 100nF;
• Temperature range: -184℃ to 250℃

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