








Product information
Introduction
A8 is a new high-power prober with a temperature range from room temperature to +200 °C and supports the
measurement of high voltage 3 kV (Tri-axis)/10 kV (coaxial) and 500A. It can test high-power chip characteristics,
which can also be tested on thin wafers or TAIKO wafers.
The innovative A8 prober has made new upgrades andimprovements in technologies such as automatic wafer
loading and unloading, micron-level full closed-loop motion control, automatic wafer contact, accurate
visual calibration, high-speed feedback communication,and data information processing.
The prober isequipped with a highly stable wafer testing technology.
Product Features
High precision and test speed, greatly improving test efficiency Micron-level fully closed-loop motion control
High voltage and high current test application Bernoulli arm supports thin wafer
Small size, light weight, and smaller footprint
24X7 hours on-chip detection













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