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Product information
Introduction
X series is a semi-automatic probe station that integrates electrical, light wave, microwave, and
other testing functions. IProfessionally respond to the performance test of advanced chips of various
materials such as 6-inch/8-inch/12-inch Wafer(downward compatible) Si, GaN, SiC and so on. It
can perform 24X7 hours on-chip detection of wafers, MEMS, biological structures, optoelectronic devices, and other integrated circuits like LEDs,
LCDs, and solar cells. It can be equipped with temperature control systems to meet customers' requirements in high and low-temperature environments.
Product Features
Prober running speed can reach 70mm/s,which improves the test efficiency by morethan 40%
-60 ℃~300 ℃ wide test temperature range
Advanced multi magnification optical display system, high-precision measurement and dynamic monitoring
provides more convenient probe contact 24X7 hours on-chip detection
Self developed software integration system with stronger compatibility
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