








Product information
Introduction
CG series probe station can provide IV/CV characteristic test, RF test, photoelectric test, electro -magnetic transport characteristic, and Hall effecttest for device and material characterization in the environment of ultra-high vacuum and high and low temperatures. By setting up components such as a vacuum chamber and radiation protection screen, integrated high temperature, low temperature, vacuum, and other testing conditions can effectively meet and provide a stable testing environment for semiconductor devices.
Product Features
Can support 4.2K-473K temperatureAnti-radiation screen design to improve sampletemperature uniformity and accuracy
Probe heat sink design to ensure accurate probe drop
Upgradable loading magnetic field
Flexible and scalable test application configuration
Automatic refrigerant flow control, automatic precisetemperature control.













![[Second-hand] laser](https://cdn.sumecdtx.com/equipment/20230818/928f9346aceb42e3b60670c380399f59.jpg)



