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sunyuchen@sumec.com.cn
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High And Low Temperature Vacuum Prober
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China
Main Products:
probe station
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Product information

Introduction

CG series probe station can provide IV/CV characteristic test, RF test, photoelectric test, electro -magnetic transport characteristic, and Hall effecttest for device and material characterization in the environment of ultra-high vacuum and high and low temperatures. By setting up components such as a vacuum chamber and radiation protection screen, integrated high temperature, low temperature, vacuum, and other testing conditions can effectively meet and provide a stable testing environment for semiconductor devices.

Product Features

Can support 4.2K-473K temperatureAnti-radiation screen design to improve sampletemperature uniformity and accuracy

Probe heat sink design to ensure accurate probe drop

Upgradable loading magnetic field

Flexible and scalable test application configuration

Automatic refrigerant flow control, automatic precisetemperature control.

 

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