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H Series Integrated Manual Probe Station


Price:
price negotiable
Brand Name:
SEMISHARECountry Region:
ChinaModel No:
H Series


SEMISHARE 

Country: China
Main Products: probe station
View more
Price:
price negotiable
Brand Name:
SEMISHARECountry Region:
ChinaModel No:
H Series


SEMISHARE 

China
Main Products:
probe station

Product information
"The chuck movement technology developed by SEMISHARE can meet your needs for efficient testing of the entire wafer. The H-series probe station is suitable for R&D laboratories, allowing them to invest their budget once."
Product Highlights
Three-stage liftable micropositioner stage for precise positioning and quick separation of probes
Standard metallographic microscope, Pad test above 1μm
Can be equipped with a laser for FA testing/laser cutting
Pneumatically controlled chuck movement technology for pulling out chuck quickly.
All products in the store
High-Low Temperature Prober

TEG Series / Panel Laser Prober

H Series Integrated Manual Probe Station

Semi-Automatic Prober

E Series 150mm Economical Manual Probe Station

M Series Basics Manual Probe Station


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