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H Series Integrated Manual Probe Station
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SEMISHARE
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Post RequirementsPost Requirements
SEMISHARE
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China
Main Products:
probe station
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Product information

"The chuck movement technology developed by SEMISHARE can meet your needs for efficient testing of the entire wafer. The H-series probe station is suitable for R&D laboratories, allowing them to invest their budget once."

Product Highlights

Three-stage liftable micropositioner stage for precise positioning and quick separation of probes

Standard metallographic microscope, Pad test above 1μm

Can be equipped with a laser for FA testing/laser cutting

Pneumatically controlled chuck movement technology for pulling out chuck quickly.

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