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high speed SEM microscope High Speed SEM | HEM6000
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CIQTEK
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CIQTEK
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China
Main Products:
Scanning Electron Microscope
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Product information

High-speed scanning electron microscope for cross-scale imaging of large-volume specimens

CIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration, dynamic optical axis, and immersion electromagnetic & electrostatic combo objective lens to achieve high-speed image acquisition whilst ensuring nano-scale resolution.

The automated operation process is designed for applications such as a more efficient and smarter large-area high-resolution imaging workflow. The imaging speed can reach more than 5 times faster than a conventional field emission scanning electron microscope (fesem).

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