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FIB DB500
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CIQTEK
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CIQTEK
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China
Main Products:
Scanning Electron Microscope
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Product information

CIQTEK DB500 is a Field Emission Scanning Electron Microscope (FE-SEM) with a Focused Ion Beam (FIB) column for nano analysis and specimen preparation, which is applied with “SuperTunnel” electron optics technology, low aberration, and magnetic-free objective lens design, with low-voltage and high-resolution ability that ensures its nano-scale analytical capability. The ion column facilitates a Ga+ liquid metal ion source with a highly stable and high-quality ion beam to ensure nano-fabrication capability.

DB500 has an integrated nano-manipulator, gas injection system, electrical anti-contamination mechanism for the objective lens, and 24 expansion ports, making it an all-around nano-analysis and fabrication platform with comprehensive configurations and expandability.

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