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中文
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+86 25-84532303
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sunyuchen@sumec.com.cn
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Testrong Self Developed ATE(Prometheus)
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China
Main Products:
ATE, PCB, IC Socket, Service
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Product information

Equipment with over 10,000 high digital channels enables large-scale parallel testing

Ultra-low power consumption design ensures greater system stability

Key architecture, system technology, and mechanical design are all developed and manufactured domestically

System tests over 50 brands, types, and capacities of memory chips (NOR NAND Flash) and logic chips

Logic testing achieves nearly 100% parallel test efficiency, with single-site and multi-site test times being almost identical. The more sites tested simultaneously, the greater the cost reduction benefits.

Unique LAES technology significantly reduces site-to-site interference, enhancing multi-site test stability and product yield

The system is equipped with online calibration functionality, ensuring test accuracy and stability (calibration can be performed online)

The system supports dynamic burn-in, stress testing, final testing, and wafer testing, with one platform supporting all test types

Combining expertise with TIS’s Socket/Pin and PCB (Loadboard/Probecard) design capabilities, we provide customers with a one-stop (Turn-Key) service, shortening the time to mass production testing while ensuring test quality

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