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Global Trading Service Platform for Machinery

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+86 25-84532303
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T-world@sumec.com.cn
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Wafer Defect Viewer
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RAPHAEL OPTECH
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Post RequirementsPost Requirements
RAPHAEL OPTECH
RAPHAEL OPTECH icon
China
Main Products:
Free-form surface measurement instrument, wafer warped film stress measurement instrument, three-dimensional measurement microscope, internal stress detection instrument, super depth of field microscope, etc
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Product information

Advantages Advanced optical imaging performance (1um lateral resolution, 12x optical zoom) Automatic wafer scanning Multi-modal imaging method Deep learning Rapid identification of various wafer defects Function Automatic wafer scanning and defect identification Automatic identification of various wafer defects, including: Automatic stitching of scratches, cracks, edges, polycrystalline and other images

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Multi-mod 3D measuring microscopeAll products in the store
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