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Wafer Defect Viewer


Price:
price negotiable
Brand Name:
RAPHAEL OPTECHCountry Region:
ChinaModel No:
DV200


RAPHAEL OPTECH 

Country: China
Main Products: Free-form surface measurement instrument, wafer warped film stress measurement instrument, three-dimensional measurement microscope, internal stress detection instrument, super depth of field microscope, etc
View more
Price:
price negotiable
Brand Name:
RAPHAEL OPTECHCountry Region:
ChinaModel No:
DV200


RAPHAEL OPTECH 

China
Main Products:
Free-form surface measurement instrument, wafer warped film stress measurement instrument, three-dimensional measurement microscope, internal stress detection instrument, super depth of field microscope, etc

Product information
Advantages Advanced optical imaging performance (1um lateral resolution, 12x optical zoom) Automatic wafer scanning Multi-modal imaging method Deep learning Rapid identification of various wafer defects Function Automatic wafer scanning and defect identification Automatic identification of various wafer defects, including: Automatic stitching of scratches, cracks, edges, polycrystalline and other images




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