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中文
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+86 25-84532303
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sunyuchen@sumec.com.cn
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White light interference for 3D measuring microscope
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RAPHAEL OPTECH
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RAPHAEL OPTECH
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China
Main Products:
Free-form surface measurement instrument, wafer warped film stress measurement instrument, three-dimensional measurement microscope, internal stress detection instrument, super depth of field microscope, etc
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Product information

                            

All products in the store
Multi-mod 3D measuring microscopeAll products in the store
Strain ViewerAll products in the store
White light interference for 3D measuring microscopeAll products in the store
Stress MapperAll products in the store
FF series Freeform Optics 3D ProfilerAll products in the store
Strain Viewer All products in the store