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Multi-mod 3D measuring microscope
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RAPHAEL OPTECH
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RAPHAEL OPTECH
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China
Main Products:
Free-form surface measurement instrument, wafer warped film stress measurement instrument, three-dimensional measurement microscope, internal stress detection instrument, super depth of field microscope, etc
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Product information

The multi-mode three-dimensional microscope Micro 2000 combines three measurement modes: nanoscale white light interferometry, spectral confocal scanning and ultra-depth-field image fusion, and has extremely high adaptability to application scenarios. Advantages √ Superior surface roughness measurement capabilities (sub-nanometer to micron levels) High efficiency large-area three-dimensional profile measurement capabilities (several micron measurement areas to 100 millimeter measurement areas) High definition large-area super-depth imaging capabilities

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