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Product information
As an emerging detection technology that combines optics and electronics, photoelectric detection has the advantages of high accuracy, fast speed, non-contact, long lifespan, easy automation and intelligence. It mainly converts the non electric information to be detected into easily accepted optical information through an optical system, and then uses photoelectric detection devices to convert the optical information into electrical signals, thereby understanding the photoelectric performance of the object to be detected. A multimodal optoelectronic detection microscope based on optoelectronic scanning measurement technology is compatible with excitation light sources in the extreme ultraviolet terahertz band. Through a scanning method combining a galvanometer and an electric displacement stage, it is possible to test various characteristic signals such as photocurrent and photovoltage, Raman spectroscopy, fluorescence lifetime, etc. of the test object in a variable temperature environment at sub micron resolution, thereby achieving corresponding optoelectronic characterization of the test object in multiple dimensions. Currently, due to its highly flexible testing dimensions and compatibility with numerous mainstream instruments, multimodal optoelectronic detection microscopes are widely used in scientific research, photovoltaic device detection, material microfabrication and laser modification, customized testing, and many other fields.
The multimodal optoelectronic microscope in the Zhulong series is a multifunctional optoelectronic comprehensive testing and microfabrication system with ultra-high stability, which can provide a variety of flexible configurations and solutions according to customer needs. The system integrates the scanning methods of electric motion table and galvanometer, which can achieve transient and steady-state photocurrent testing and scanning imaging, fluorescence lifetime testing and scanning imaging, Raman spectroscopy testing, second harmonic testing, fluorescence spectrum acquisition, emission and absorption testing and scanning imaging at the spectral end. In addition, the entire system can be paired with femtosecond pulse lasers and our independently developed low-temperature system for temperature testing, as well as micro machining and defect marking on device surfaces. Multimodal optoelectronic microscopes will provide strong support for numerous new productivity fields, helping to promote the development and technological innovation of related fields in China.
Candle Dragon Series Multimodal Optoelectronic Microscope Product Highlights:
Ultra wide multi wavelength excitation light source - Ultra wide spectral line coverage range in the extreme ultraviolet terahertz band (266 nm-0.8 THz) - Multiple optional steady-state and transient light sources - Provides software control of laser power and frequency
Multi functional testing platform - Supports DC, AC, and high-frequency probes (leakage current<100fA) - Supports wire bonding testing at room temperature and temperature (10 K-450 K) - Supports probe testing at room temperature and temperature (77K-450K) - Compatible with multiple source meters such as 245042006221- Compatible with multiple lock-in amplifiers such as OE1201 and SR810
Multi functional testing and microfabrication module - supports photocurrent testing and scanning imaging - supports second harmonic and electroluminescence testing - supports microfabrication and defect marking on device surfaces - supports multiple scanning methods for electric displacement tables and galvanometers - supports fluorescence lifetime and Raman spectroscopy testing and scanning imaging
System highly automated - electric microscopy focusing - multiple optional light acquisition modes - electric switching of transient and steady-state light sources and paths - electric polarization testing of linearly and circularly polarized light
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