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Desktop RF SoC Chip Tester
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Product information

The TeraSight®E6400 Double-sided RF SoC Chip Tester is a double-sided semiconductor tester that supports radio frequency system-on-chip (SoC) testing. It adopts an 8U standard chassis structure and realizes modular testing through a 6U functional board. The combination of functions can be used for rapid technical verification, small-batch testing, scientific teaching and training of wafer level chip (CP), front-end module (FEM), system-on-chip (SoC) and system-on-chip (SoC) products. The sealed physical structure of TeraSight®E6400 can greatly reduce the space requirements for the test laboratory. The flexible test structure extremely reduces test costs. Equipped with S1000 automated test software, it is flexible and convenient to use.

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