







Product information
TeraSight®E6500 RF Semiconductor Tester is a semiconductor tester with strong RF testing capabilities and compatible with some analog and digital mixed-signal testing capabilities. It can support wafer-level, package-level and system-level testing of various RF chips. The rich hardware resource configuration makes it well adapted to the design verification testing of high-performance chips, mass production testing requirements of general RF chips, RF SoC chips, and mixed-signal chips.& nbsp;
TeraSight®E6500's flexible RF, analog and analog modular instrument resource configuration framework can be used for single and multi-chip parallel testing. It has rich test resources and test case support for different test objects, greatly improving the coverage of test projects and reducing the complexity of test development.& nbsp;
At the same time, the TeraSight® E6500 is equipped with standardized external device interfaces, which can be interconnected with different test sorters, probe stations, and external instruments. The open software architecture supports the import of different test case types.













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